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Proceedings of CAD'16, 2016, 357-362
Two-step Mapping Parameterization of Scattered Points for Wrap-like Free-form Surfaces Reconstruction

Jinting Xu, Yuwen Sun, Dalian University of Technology
Yuan-Shin Lee, North Carolina State University

Abstract. Reverse engineering (RE) is a process that the measured data from a physical part are transformed into a CAD model. It has been the focus of significant interest in the last three decades and used widely in aerospace, automobile industry to facilitate product design, analysis and manufacture. Especially when the nominal CAD model or original drawing is not available, it is crucial to reconstruct a CAD model from an existing part for the downstream geometric processing and manufacturing applications. For free-form surface reconstruction in RE, the parameterization of scattered points is one of the most important step, there are many methods proposed for the data parameterization. The commonly used ones are uniform parameterization, cumulative chord length parameterization and centripetal parameterization. These methods work well when the data points are arranged in a chain for curves or a grid for surfaces, but they will fail when the measured data points are scattered unless the processes of slicing, segmentation and sorting are performed in advance.

Keywords. Design and manufacturing, Surface reconstruction, Reverse engineering, Mapping parameterization.

DOI: 10.14733/cadconfP.2016.357-362